產(chǎn)品詳情
簡單介紹：
三箱式冷熱沖擊試驗箱分為：高溫區(qū)、測試區(qū)、低溫區(qū)三部分，待測產(chǎn)品放置于測試區(qū)中，沖擊時高溫區(qū)或低溫區(qū)的溫度按照程序自動進入測試區(qū)進行沖擊, 測試產(chǎn)品有五金端子、塑料、橡膠、電子，電池，手機，等材料行業(yè)必備的測試設(shè)備，測試材料結(jié)構(gòu)或復(fù)合材料，在瞬間下經(jīng)極高溫及極低溫的連續(xù)環(huán)境下忍受的程度，得以在短時間內(nèi)檢測試樣因熱脹冷縮所引起的化學(xué)變化或物理傷害環(huán)境條件下貯存和使用的適應(yīng)性，適用于學(xué)校，工廠，**，科研，等單位。
Three-box cold and heat impact test chamber is divided into: , test area, high low temperature zone of three parts, products placed under test in the test area, temperature shock at high temp
詳情介紹：
試驗箱測試標(biāo)準(zhǔn)
Test chamber test standard
GB/T 2423.22-2012 第2部分：試驗方法 試驗N：溫度變化 ；
IEC 60068-2-14-2009 環(huán)境試驗 第2-14部分試驗 試驗N溫度變化；
GJB 150.5A-2009 溫度沖擊試驗；
GJB 360B-2009 電子及電氣元件試驗方法。
Part 2: test methods. Test N: change in temperature.
IEC 60068-2-14-2009 environmental tests -- part 2-14 tests N temperature variation;
GJB 150.5a-2009 temperature impact test;
GJB 360b-2009 test method for electronic and electrical components.
試驗箱性能確認(rèn)符合標(biāo)準(zhǔn)
The test chamber performance is confirmed to meet the standard
GB/T2424.5-2006電工電子產(chǎn)品環(huán)境試驗 溫度試驗箱性能確認(rèn)；
GB/T5170.2-2008電子電工產(chǎn)品環(huán)境試驗設(shè)備檢驗方法+溫度試驗設(shè)備；
JJF1101-2003環(huán)境試驗設(shè)備溫度、濕度校準(zhǔn)規(guī)范
Confirm the performance of environmental test temperature test chamber for electrical and electronic products;
Test method of environmental test equipment for electronic and electrical products + temperature test equipment;
Jjf1101-2003 calibration specification for temperature and humidity of environmenta
l test equipment
Test chamber test standard
GB/T 2423.22-2012 第2部分：試驗方法 試驗N：溫度變化 ；
IEC 60068-2-14-2009 環(huán)境試驗 第2-14部分試驗 試驗N溫度變化；
GJB 150.5A-2009 溫度沖擊試驗；
GJB 360B-2009 電子及電氣元件試驗方法。
Part 2: test methods. Test N: change in temperature.
IEC 60068-2-14-2009 environmental tests -- part 2-14 tests N temperature variation;
GJB 150.5a-2009 temperature impact test;
GJB 360b-2009 test method for electronic and electrical components.
試驗箱性能確認(rèn)符合標(biāo)準(zhǔn)
The test chamber performance is confirmed to meet the standard
GB/T2424.5-2006電工電子產(chǎn)品環(huán)境試驗 溫度試驗箱性能確認(rèn)；
GB/T5170.2-2008電子電工產(chǎn)品環(huán)境試驗設(shè)備檢驗方法+溫度試驗設(shè)備；
JJF1101-2003環(huán)境試驗設(shè)備溫度、濕度校準(zhǔn)規(guī)范
Confirm the performance of environmental test temperature test chamber for electrical and electronic products;
Test method of environmental test equipment for electronic and electrical products + temperature test equipment;
Jjf1101-2003 calibration specification for temperature and humidity of environmenta
l test equipment